دورية أكاديمية
Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications.
| العنوان: | Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications. |
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| المؤلفون: | Zuo, Jian-Min, Hsiao, Haw-Wen, Yin, Kaijun, Ni, Hsu-Chih, Ni, Haoyang, Busch, Robert, Yuan, Renliang, Zhang, Jiong |
| المصدر: | Microscopy & Microanalysis; 2023 Supplement, p249-250, 2p |
| قاعدة البيانات: | Complementary Index |
Full Text Finder | تدمد: | 14319276 |
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| DOI: | 10.1093/micmic/ozad067.112 |