دورية أكاديمية

IGZO/SnOx-based dynamic memristor with fading memory effect for reservoir computing.

التفاصيل البيبلوغرافية
العنوان: IGZO/SnOx-based dynamic memristor with fading memory effect for reservoir computing.
المؤلفون: Lee, Subaek, Park, Yongjin, Jung, Sungyeop, Kim, Sungjun
المصدر: Journal of Chemical Physics; 12/21/2023, Vol. 159 Issue 23, p1-10, 10p
مصطلحات موضوعية: PATTERN recognition systems, X-ray photoelectron spectroscopy, SHORT-term memory, BIOLOGICAL systems, TRANSMISSION electron microscopy
مستخلص: We investigate a synaptic device with short-term memory characteristics using IGZO/SnOx as the switching layer. The thickness and components of each layer are analyzed by using x-ray photoelectron spectroscopy and transmission electron microscopy. The memristor exhibits analog resistive switching and a volatile feature with current decay over time. Moreover, through ten cycles of potentiation and depression, we demonstrate stable conductance modulation, leading to high-accuracy Modified National Institute of Standards and Technology pattern recognition. We effectively emulate the learning system of a biological synapse, including paired-pulse facilitation, spiking-amplitude-dependent plasticity, and spiking-rate-dependent plasticity (SRDP) by pulse trains. Ultimately, 4-bit reservoir computing divided into 16 states is incarnated using a pulse stream considering short-term memory plasticity and decay properties. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:00219606
DOI:10.1063/5.0185677