دورية أكاديمية
Optical and microstructural characterization of Er3+ doped epitaxial cerium oxide on silicon.
العنوان: | Optical and microstructural characterization of Er3+ doped epitaxial cerium oxide on silicon. |
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المؤلفون: | Grant, Gregory D., Zhang, Jiefei, Masiulionis, Ignas, Chattaraj, Swarnabha, Sautter, Kathryn E., Sullivan, Sean E., Chebrolu, Rishi, Liu, Yuzi, Martins, Jessica B., Niklas, Jens, Dibos, Alan M., Kewalramani, Sumit, Freeland, John W., Wen, Jianguo, Poluektov, Oleg G., Heremans, F. Joseph, Awschalom, David D., Guha, Supratik |
المصدر: | APL Materials; Feb2024, Vol. 12 Issue 2, p1-9, 9p |
مصطلحات موضوعية: | CERIUM oxides, SILICON oxide, MOLECULAR beam epitaxy, ELECTRON spin, SILICON films, EPITAXY |
مستخلص: | Rare-earth ion dopants in solid-state hosts are ideal candidates for quantum communication technologies, such as quantum memories, due to the intrinsic spin–photon interface of the rare-earth ion combined with the integration methods available in the solid state. Erbium-doped cerium oxide (Er:CeO |
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قاعدة البيانات: | Complementary Index |
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