دورية أكاديمية
Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network.
العنوان: | Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network. (English) |
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المؤلفون: | XU Hongwei, CONG Zhongxiao, YANG Xiaolu, ZHOU Zhongming, CHEN Yinsheng, LIN Haijun |
المصدر: | Electrical Measurement & Instrumentation; Feb2024, Vol. 61 Issue 2, p179-184, 6p |
قاعدة البيانات: | Complementary Index |
تدمد: | 10011390 |
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DOI: | 10.19753/j.issn1001-1390.2024.02.026 |