دورية أكاديمية
Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network.
| العنوان: | Reliability prediction of metering terminal based on whole annealing genetic algorithm wavelet neural network. (English) |
|---|---|
| المؤلفون: | XU Hongwei, CONG Zhongxiao, YANG Xiaolu, ZHOU Zhongming, CHEN Yinsheng, LIN Haijun |
| المصدر: | Electrical Measurement & Instrumentation; Feb2024, Vol. 61 Issue 2, p179-184, 6p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 10011390 |
|---|---|
| DOI: | 10.19753/j.issn1001-1390.2024.02.026 |