دورية أكاديمية

MOID: Many-to-One Patent Graph Embedding Base Infringement Detection Model.

التفاصيل البيبلوغرافية
العنوان: MOID: Many-to-One Patent Graph Embedding Base Infringement Detection Model.
المؤلفون: Liu, Weidong, Li, Fei, Pei, Senjun, Cheng, Chunming
المصدر: International Journal of Software Engineering & Knowledge Engineering; Mar2024, Vol. 34 Issue 3, p449-465, 17p
مصطلحات موضوعية: PATENT infringement, PATENT applications, PATENTS
مستخلص: With the increasing number of patent applications over the years, instances of patent infringement cases have become more frequent. However, traditional manual patent infringement detection models are no longer suitable for large-scale infringement detection. Existing automated models mainly focus on detecting one-to-one patent infringements, but neglect the many-to-one scenarios. The many-to-one patent infringement detection model faces some major challenges. First, the diversity of patent domains, complexity of content and ambiguity of features make it difficult to extract and represent patent features. Second, patent infringement detection relies on the correlation between patents and the comparison of contextual information as the key factors, but modeling the process and drawing conclusions present challenges. To address these challenges, we propose a many-to-one patent graph (MPG) embedding base infringement detection model. Our model extracts the relationship between keywords and patents, as well as association relation between keywords from many-to-one patent texts (MPTs), to construct a MPG. We obtain patent infringement features through graph embedding of MPG. By using these embedding features as input, the many-to-one infringement detection (MOID) model outputs the conclusion on whether a patent is infringed or not. The comparative experimental results indicate that our model improves accuracy, precision and F-measure by 3.81%, 11.82% and 5.37%, respectively, when compared to the state-of-the-art method. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:02181940
DOI:10.1142/S0218194023420019