التفاصيل البيبلوغرافية
| العنوان: |
Effects of microstructure on the properties of ferroelectric lead zirconate titanate (PZT) thin films. |
| المؤلفون: |
Goh, W. C., Yao, K., Ong, C. K. |
| المصدر: |
Applied Physics A: Materials Science & Processing; Oct2005, Vol. 81 Issue 5, p1089-1093, 5p |
| مصطلحات موضوعية: |
THIN films, SOLID state electronics, MICROSTRUCTURE, CONSTITUTION of matter, PULSED laser deposition, COATING processes |
| مستخلص: |
Lead zirconate titanate (PZT) thin films were prepared with pulsed laser deposition and sol–gel techniques. The PZT films fabricated by these two techniques have similar randomly oriented single perovskite phases, but the film derived from the pulsed laser deposition exhibits a more compact and flat morphology. The dielectric, ferroelectric, and piezoelectric properties of the two kinds of films are comparatively characterized and discussed. It is observed that a denser microstructure would lead to a significantly higher dielectric constant and remanent polarization and a much lower coercive electric field, but only a relatively slight enhancement on the piezoelectric constant. The film with a looser microstructure could have a substantially higher piezoelectric voltage constant g33 due to the much lower dielectric constant. Our results and discussion provide a better understanding of the relationship between the microstructure and the film properties, which is essential in order to tailor the microstructure and hence determine the performance aiming at a specific application. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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