التفاصيل البيبلوغرافية
| العنوان: |
Publisher's Note: “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator” [Appl. Phys. Lett. 87, 133114 (2005)]. |
| المؤلفون: |
Toshu An, Eguchi, Toyoaki, Akiyama, Kotone, Hasegawa, Yukio |
| المصدر: |
Applied Physics Letters; 4/3/2006, Vol. 88 Issue 14, p149903, 1p |
| مصطلحات موضوعية: |
ATOMIC force microscopy |
| مستخلص: |
A correction to the article "Atomically-Resolved Imaging by Frequency-Modulation Atomic Force Microscopy Using a Quartz Length-Extension Resonator" that was published on October 20, 2005. |
| قاعدة البيانات: |
Complementary Index |
Find this article in full text from Scitation.