دورية أكاديمية
Publisher's Note: “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator” [Appl. Phys. Lett. 87, 133114 (2005)].
العنوان: | Publisher's Note: “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator” [Appl. Phys. Lett. 87, 133114 (2005)]. |
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المؤلفون: | Toshu An, Eguchi, Toyoaki, Akiyama, Kotone, Hasegawa, Yukio |
المصدر: | Applied Physics Letters; 4/3/2006, Vol. 88 Issue 14, p149903, 1p |
مصطلحات موضوعية: | ATOMIC force microscopy |
مستخلص: | A correction to the article "Atomically-Resolved Imaging by Frequency-Modulation Atomic Force Microscopy Using a Quartz Length-Extension Resonator" that was published on October 20, 2005. |
قاعدة البيانات: | Complementary Index |
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