Extension of 248-nm optical lithography: a thin film imaging approach.

التفاصيل البيبلوغرافية
العنوان: Extension of 248-nm optical lithography: a thin film imaging approach.
المؤلفون: Lin, Qinghuang, Katnani, Ahmad D., Brunner, Timothy A., DeWan, Charlotte, Fairchok, Cindy, LaTulipe, Douglas C., Simons, John P., Petrillo, Karen E., Babich, Katherina, Seeger, David E., Angelopoulos, Marie, Sooriyakumaran, Ratnam, Wallraff, Gregory M., Hofer, Donald C.
المصدر: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p278-288, 11p
قاعدة البيانات: Complementary Index
الوصف
تدمد:0277786X
DOI:10.1117/12.312417