Enhanced hole shape of flash devices in ArF lithography by eliptical mask bias technique.

التفاصيل البيبلوغرافية
العنوان: Enhanced hole shape of flash devices in ArF lithography by eliptical mask bias technique.
المؤلفون: Jeon, Young-Doo, Jun, Sungho, Kang, Jae-Hyun, Lee, Sang-Uk, Kim, Jeahee, Kim, Keeho
المصدر: Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65183W-65183W-8, 8p
قاعدة البيانات: Complementary Index
الوصف
تدمد:0277786X
DOI:10.1117/12.712016