مؤتمر
Inverse modeling applied to Scanning Capacitance Microscopy for improved spatial resolution and accuracy.
| العنوان: | Inverse modeling applied to Scanning Capacitance Microscopy for improved spatial resolution and accuracy. |
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| المؤلفون: | McMurray, J. S., Williams, C. C. |
| المصدر: | AIP Conference Proceedings; Nov1998, Vol. 449 Issue 1, p731-735, 5p |
| قاعدة البيانات: | Complementary Index |
Find this article in full text from Scitation. | تدمد: | 0094243X |
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| DOI: | 10.1063/1.56917 |