التفاصيل البيبلوغرافية
العنوان: |
Self-contained measurement of thin-film superconducting penetration depths and nonsuperconducting film thicknesses in Josephson integrated circuits. |
المؤلفون: |
Henkels, W. H. |
المصدر: |
Journal of Applied Physics; 2/1/1985, Vol. 57 Issue 3, p855, 6p, 5 Diagrams, 4 Charts |
مصطلحات موضوعية: |
JOSEPHSON junctions, INTEGRATED circuits, MEASUREMENT |
مستخلص: |
Presents a study which proposed improvements to the technique for accurate measurements of insulator and thin-film resistor thickness in superconducting Josephson integrated systems. Information on the basic technique; Measurements; Conclusions. |
قاعدة البيانات: |
Complementary Index |