دورية أكاديمية
Self-contained measurement of thin-film superconducting penetration depths and nonsuperconducting film thicknesses in Josephson integrated circuits.
| العنوان: | Self-contained measurement of thin-film superconducting penetration depths and nonsuperconducting film thicknesses in Josephson integrated circuits. |
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| المؤلفون: | Henkels, W. H. |
| المصدر: | Journal of Applied Physics; 2/1/1985, Vol. 57 Issue 3, p855, 6p, 5 Diagrams, 4 Charts |
| مصطلحات موضوعية: | JOSEPHSON junctions, INTEGRATED circuits, MEASUREMENT |
| مستخلص: | Presents a study which proposed improvements to the technique for accurate measurements of insulator and thin-film resistor thickness in superconducting Josephson integrated systems. Information on the basic technique; Measurements; Conclusions. |
| قاعدة البيانات: | Complementary Index |
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