التفاصيل البيبلوغرافية
العنوان: |
Elimination of residual image distortion in the stigmatic ion microscope. |
المؤلفون: |
Bernius, Mark T., Ling, Yong-Chien, Morrison, George H. |
المصدر: |
Journal of Applied Physics; 3/1/1987, Vol. 61 Issue 5, p1677, 5p |
مصطلحات موضوعية: |
LIGHT deflectors, FIELD ion microscopes |
مستخلص: |
Presents information on a study which incorporated a combination of electrostatic octupole stigmator and cosine deflector into the secondary ion-optical lattice of the stigmatic ion microscope. Apparatus and methods; Results of digital image superpositioning; Numerical evaluations of image resolution. |
قاعدة البيانات: |
Complementary Index |