دورية أكاديمية

Elimination of residual image distortion in the stigmatic ion microscope.

التفاصيل البيبلوغرافية
العنوان: Elimination of residual image distortion in the stigmatic ion microscope.
المؤلفون: Bernius, Mark T., Ling, Yong-Chien, Morrison, George H.
المصدر: Journal of Applied Physics; 3/1/1987, Vol. 61 Issue 5, p1677, 5p
مصطلحات موضوعية: LIGHT deflectors, FIELD ion microscopes
مستخلص: Presents information on a study which incorporated a combination of electrostatic octupole stigmator and cosine deflector into the secondary ion-optical lattice of the stigmatic ion microscope. Apparatus and methods; Results of digital image superpositioning; Numerical evaluations of image resolution.
قاعدة البيانات: Complementary Index