التفاصيل البيبلوغرافية
| العنوان: |
High resolution x-ray diffraction analysis of Si/GaAs superlattices. |
| المؤلفون: |
Gillespie, H. J., Wade, J. K., Crook, G. E., Matyi, R. J. |
| المصدر: |
Journal of Applied Physics; 1/1/1993, Vol. 73 Issue 1, p95, 8p, 2 Black and White Photographs, 1 Chart, 8 Graphs |
| مصطلحات موضوعية: |
SUPERLATTICES, HETEROSTRUCTURES |
| مستخلص: |
Presents information on a study that reported the growth and characterization of several silicon/GaAs superlattices as part of an effort to better understand the properties of the structures. Experimental procedure; Results and discussion on the study; Conclusions. |
| قاعدة البيانات: |
Complementary Index |
Find this article in full text from Scitation.