دورية أكاديمية

Characterization of a radio-frequency discharge used for downstream plasma oxidation of Si.

التفاصيل البيبلوغرافية
العنوان: Characterization of a radio-frequency discharge used for downstream plasma oxidation of Si.
المؤلفون: Cook, J. G., LeBrun, L., Zhongming, Li, Ogryzlo, E. A.
المصدر: Journal of Applied Physics; 2/15/1995, Vol. 77 Issue 4, p1690, 6p, 1 Diagram, 1 Chart, 5 Graphs
مصطلحات موضوعية: RADIO frequency discharges, SILICON, SILICA
مستخلص: Focuses on a study on the characterization of a radio-frequency discharge used for downstream plasma oxidation of silicon. Introduction to high-quality silicon dioxide films; Experimental details; Results and discussion.
قاعدة البيانات: Complementary Index
الوصف
تدمد:00218979
DOI:10.1063/1.358859