Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors.

التفاصيل البيبلوغرافية
العنوان:	Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors.
المؤلفون:	Golovashchenko, R.V., Goroshko, O.V., Derkach, V.N., Korzh, V.G., Tarapov, S.I.
المصدر:	Microwave & Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference; 2011, p922-923, 2p
قاعدة البيانات:	Complementary Index

الوصف
ردمك:	9781457708831