التفاصيل البيبلوغرافية
| العنوان: |
Structure- and composition-dependent electron field emission from nitrogenated carbon nanotips. |
| المؤلفون: |
Wang, B. B., Ostrikov, K., Gong, C. S., Xie, E. Q., Wang, R. Z. |
| المصدر: |
Journal of Applied Physics; Oct2012, Vol. 112 Issue 8, p084304, 7p |
| مصطلحات موضوعية: |
ELECTRON emission research, NANOSTRUCTURED materials, CARBON, PLASMA-enhanced chemical vapor deposition, PHOTOELECTRON spectroscopy, MICROSTRUCTURE |
| مستخلص: |
The electron field emission (EFE) properties of nitrogenated carbon nanotips (NCNTPs) were studied under high-vacuum conditions. The NCNTPs were prepared in a plasma-assisted hot filament chemical vapor deposition system using CH4 and N2 as the carbon and nitrogen sources, respectively. The work functions of NCNTPs were measured using x-ray photoelectron spectroscopy. The morphological and structural properties of NCNTPs were studied by field emission scanning electron microscopy, micro-Raman spectroscopy, and x-ray photoelectron spectroscopy. The field enhancement factors of NCNTPs were calculated using relevant EFE models based on the Fowler-Nordheim approximation. Analytical characterization and modeling results were used to establish the relations between the EFE properties of NCNTPs and their morphology, structure, and composition. It is shown that the EFE properties of NCNTPs can be enhanced by the reduction of oxygen termination on the surface as well as by increasing the ratio of the NCNTP height to the radius of curvature at its top. These results also suggest that a significant amount of electrons is emitted from other surface areas besides the NCNTP tops, contrary to the common belief. The outcomes of this study advance our knowledge on the electron emission properties of carbon nanomaterials and contribute to the development of the next-generation of advanced applications in the fields of micro- and opto-electronics. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |
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