التفاصيل البيبلوغرافية
| العنوان: |
Study of dielectric relaxation behavior of electron beam-cured conductive carbon black-filled ethylene acrylic elastomer. |
| المؤلفون: |
Sahoo, Bibhu, Naskar, Kinsuk, Dubey, K., Choudhary, Ram, Tripathy, Deba |
| المصدر: |
Journal of Materials Science; Jan2013, Vol. 48 Issue 2, p702-713, 12p, 1 Black and White Photograph, 1 Diagram, 5 Charts, 7 Graphs |
| مصطلحات موضوعية: |
DIELECTRIC relaxation, ELECTRON beam curing, CARBON-black testing, ELASTOMERS, CROSSLINKING (Polymerization), MATERIALS science |
| مستخلص: |
Composites based on ethylene acrylic elastomer (AEM) filled with a special type of conductive carbon black (CCB) have been prepared by two-roll mixing mill. The compression-molded sheet of the prepared composites have been subjected to electron beam (EB) radiation dose up to 400 kGy to induce radiation crosslinked composites. The crosslinked density has been calculated according to Flory-Rehner equation and is found to increase with increasing EB dose and CCB loading. Chain scission-to-crosslink density has been calculated by Charlesby-Pinner equation, which shows decreasing trend with increasing radiation dose. The dielectric relaxation behaviors of different doses of EB-treated AEM/CCB composites have been extensively studied as a function of frequency of applied electric field (101-106 Hz), CCB loading [0-30 phr (parts per hundred)], temperature (25-120 °C), and EB dose (50-400 kGy). It is observed that the dielectric permittivity (ε′) increases with CCB loading and temperature, but decreases with increasing EB dose. This can be explained on the basis of interfacial polarization. Based on dielectric loss tangent (tan δ) values, it is observed that the dielectric relaxation time decreases with increases in the filler loading and temperature. However, it increases with increase in the radiation doses. Both the real and imaginary parts of the impedance ( Z′ and Z″) have been found to decrease with increase in conductive filler loading. The AC conductivity (σac) increases with increase in the CCB concentration, test temperature, and radiation doses, which is attributed to the more pronounced hopping and tunneling mechanism. The percolation threshold (φcrit) occurred in the range of 16 phr CCB loading. The dispersions of CCB phase in AEM matrix below and above percolation have been captured by the transmission electron microscope photomicrographs. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |
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