التفاصيل البيبلوغرافية
| العنوان: |
Single Event Induced Multiple Bit Errors and the Effects of Logic Masking. |
| المؤلفون: |
Berg, Melanie D., Kim, Hak S., Phan, Anthony D., Seidlick, Christina M., LaBel, Kenneth A., Pellish, Jonathan A. |
| المصدر: |
IEEE Transactions on Nuclear Science; Dec2013 Part 1, Vol. 60 Issue 6, p4192-4199, 8p |
| مصطلحات موضوعية: |
SINGLE event effects, BIT error rate measurement, HEAVY ions, FIELD programmable gate arrays, PROGRAMMABLE logic devices |
| مستخلص: |
We apply a model and heavy-ion cross section data to predict the potential that one single event upset (SEU) will induce multiple bit errors (MBEs) by the next clock-cycle of a synchronous design. [ABSTRACT FROM PUBLISHER] |
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