التفاصيل البيبلوغرافية
| العنوان: |
Very thin films of symmetric diblock copolymers. |
| المؤلفون: |
Kilian, H. G., Lagaly, G., Ewen, B., Fischer, E. W., Fytas, G., Anastasiadis, S. H., Menelle, A., Russell, T. P., Satija, S. K., Majkrazak, C. F. |
| المصدر: |
Application of Scattering Methods to the Dynamics of Polymer Systems; 1993, p88-92, 5p |
| مستخلص: |
The morphology of thin films of symmetric diblock copolymers has been investigated by neutron and X-ray reflectivity and X-ray photoelectron spectroscopy, for thicknesses less than 3L/2, where L is the long period of the lamellar morphology in the bulk. The constrains placed on a copolymer film by the presence of the two surfaces can produce severe perturbations on the morphology, due to the interactions of the copolymer blocks with the air and the substrate interfaces. It is possible to induce variations in the chain extension and in the interfacial mixing, and to force a normally microphase separated copolymer into a homogenecous state. [ABSTRACT FROM AUTHOR] |
|
Copyright of Application of Scattering Methods to the Dynamics of Polymer Systems is the property of Springer eBooks and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| قاعدة البيانات: |
Supplemental Index |
Full Text Finder