التفاصيل البيبلوغرافية
| العنوان: |
Final testing: a secure release gate towards module manufacturing. |
| المؤلفون: |
Ackermann, Nico, Gutewort, Volker, Quinque, Michael, Kühne, Marcel, von Kamienski, Elard Stein, Schulze, Achim, Wichtendahl, Ralph |
| المصدر: |
Photovoltaics International; May2010 2nd Quarter, Issue 8, p88-92, 5p, 1 Color Photograph, 5 Graphs |
| مصطلحات موضوعية: |
SOLAR cells, PHOTOVOLTAIC cells, CUSTOMER satisfaction, PRODUCTION control, FACTORY management |
| مستخلص: |
Among all of the tests performed in the production chain of solar cells, each with the scope of production control and the aim of driving engineering improvements, the electrical final test is certainly the most important. The final test defines the gate to module manufacturing and has a direct impact on finances and customer satisfaction. The test procedure itself is well known and continues to undergo constant further development, but that shall not be the scope of this article. This paper will elucidate on the issues faced by bringing these tests into high volume production, highlighting some issues on measurement accuracy and degradation of the internal calibration standards. In addition to pure electrical testing, the paper will discuss the Q-Cells approach to identifying hot spots and subsequent binning of the affected cells without adding process time to the test procedure, and will show their straightforward correlation to heat generation of these hot spots in real-life condition-encapsulated module tests. [ABSTRACT FROM AUTHOR] |
|
Copyright of Photovoltaics International is the property of Solar Media Ltd. and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| قاعدة البيانات: |
Supplemental Index |
