دورية
New understanding of LDD NMOS hot-carrier degradation and device lifetime at cryogenic temperatures
| العنوان: | New understanding of LDD NMOS hot-carrier degradation and device lifetime at cryogenic temperatures |
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| المؤلفون: | Wang-Ratkovic, J., Lacoe, R. C., MacWilliams, K., Song, M., Brown, S., Yabiku, G. |
| المصدر: | Microelectronics Reliability; 1997, Vol. 37 Issue: 10 p1747-1754, 8p |
| قاعدة البيانات: | Supplemental Index |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/S0026-2714(97)00153-4 |