دورية
Electrical parameters degradation law of MOSFET during ageing
| العنوان: | Electrical parameters degradation law of MOSFET during ageing |
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| المؤلفون: | Mourrain, C., Tourniol, C., Bouzid, M. J. |
| المصدر: | Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1115-1120, 6p |
| قاعدة البيانات: | Supplemental Index |
Full Text Finder | تدمد: | 00262714 |
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| DOI: | 10.1016/S0026-2714(98)00139-5 |