Novel technologies in coater/developer to improve the defectivity for advanced EUV patterning materials

التفاصيل البيبلوغرافية
العنوان: Novel technologies in coater/developer to improve the defectivity for advanced EUV patterning materials
المؤلفون: Sanders, Daniel P., Guerrero, Douglas, Kamei, Yuya, Onitsuka, Tomoya, Yamauchi, Takashi, Shiozawa, Takahiro, Kuwahara, Yuhei, Kawakami, Shinichiro, Fujimoto, Seiji, Hara, Arisa, Shimura, Satoru
المصدر: Proceedings of SPIE; July 2022, Vol. 12055 Issue: 1 p120550O-120550O-7, 1084958p
قاعدة البيانات: Supplemental Index
الوصف
تدمد:0277786X
DOI:10.1117/12.2613643