Advances in Aging Compact Model for Hot Carrier Degradation in SiGe HBTs under Dynamic Operating conditions for reliability-aware circuit design
العنوان: | Advances in Aging Compact Model for Hot Carrier Degradation in SiGe HBTs under Dynamic Operating conditions for reliability-aware circuit design |
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المؤلفون: | Mukherjee, C, Marc, F., Couret, M, Fischer, G, Jaoul, M, Celi, D., Aufinger, K, Zimmer, T., Maneux, C. |
المساهمون: | Laboratoire de l'intégration, du matériau au système (IMS), Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS), Innovations for High Performance Microelectronics (IHP), STMicroelectronics [Crolles] (ST-CROLLES), Infineon Technologies AG [München], European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Fregonese, Sebastien, TowARds Advanced bicmos NanoTechnology platforms for rf and thz applicatiOns - TARANTO - - H20202017-04-01 - 2021-02-28 - 737454 - VALID, Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
المصدر: | European Microwave Week Workshop Recent advances in SiGe BiCMOS: technologies, modelling & circuits for 5G, radar & imaging European Microwave Week Workshop Recent advances in SiGe BiCMOS: technologies, modelling & circuits for 5G, radar & imaging, Sep 2019, Paris, France |
بيانات النشر: | HAL CCSD, 2019. |
سنة النشر: | 2019 |
مصطلحات موضوعية: | [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS |
الوصف: | International audience |
اللغة: | English |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4f4f20823a73f509554903b8dc21b51c https://hal.science/hal-02386290 |
رقم الأكسشن: | edsair.dedup.wf.001..4f4f20823a73f509554903b8dc21b51c |
قاعدة البيانات: | OpenAIRE |
الوصف غير متاح. |