Ultra-thin oxide films on SiO2: An STM study of their thermal stability in the presence of Au deposit

التفاصيل البيبلوغرافية
العنوان: Ultra-thin oxide films on SiO2: An STM study of their thermal stability in the presence of Au deposit
المؤلفون: Wang, J, Mitchell, CEJ, Egdell, RG, Foord, JS
سنة النشر: 2016
الوصف: The annealing of Au particles deposited onto the ultrathin layers of SiO2 on Si (111) has been studied in real time with a high temperature scanning tunnelling microscopy. Annealing did not create significant changes to the morphology of the surface until the surface was heated up to more than 920 K when the gold particles started to display a preference for the step edge. Further heating caused the decomposition of the oxide layer with the formation of voids on the surface in the surface step edge area. Comparison between the gold assisted oxide decomposition and pure oxide decomposition indicates that the two decomposition routes proceed with different mechanisms.
اللغة: English
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::73563444a8f3b6dadd24f13c6a22a930
https://ora.ox.ac.uk/objects/uuid:9155ada5-1cf8-4f35-b971-3c8f2d02cf59
حقوق: OPEN
رقم الأكسشن: edsair.dedup.wf.001..73563444a8f3b6dadd24f13c6a22a930
قاعدة البيانات: OpenAIRE