HeapExpo: Pinpointing Promoted Pointers to Prevent Use-After-Free Vulnerabilities

التفاصيل البيبلوغرافية
العنوان: HeapExpo: Pinpointing Promoted Pointers to Prevent Use-After-Free Vulnerabilities
المؤلفون: Brendan Dolan-Gavitt, Zekun Shen
المصدر: ACSAC
بيانات النشر: ACM, 2020.
سنة النشر: 2020
مصطلحات موضوعية: 021110 strategic, defence & security studies, Memory errors, Computer science, Processor register, 0211 other engineering and technologies, Spec#, 02 engineering and technology, computer.software_genre, Dangling pointer, TheoryofComputation_LOGICSANDMEANINGSOFPROGRAMS, 020204 information systems, Pointer (computer programming), 0202 electrical engineering, electronic engineering, information engineering, Operating system, Overhead (computing), Compiler, Legacy code, computer, computer.programming_language
الوصف: Use-after-free (UAF) vulnerabilities, in which dangling pointers remain after memory is released, remain a persistent problem for applications written in C and C++. In order to protect legacy code, prior work has attempted to track pointer propagation and invalidate dangling pointers at deallocation time, but this work has gaps in coverage, as it lacks support for tracking program variables promoted to CPU registers. Moreover, we find that these gaps can significantly hamper detection of UAF bugs: in a preliminary study with OSS-Fuzz, we found that more than half of the UAFs in real-world programs we examined (10/19) could not be detected by prior systems due to register promotion. In this paper, we introduce HeapExpo, a new system that fills this gap in coverage by parsimoniously identifying potential dangling pointer variables that may be lifted into registers by the compiler and marking them as volatile. In our experiments, we find that HeapExpo effectively detects UAFs missed by other systems with an overhead of 35% on the majority of SPEC CPU2006 and 66% when including two benchmarks that have high amounts of pointer propagation.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0296e587d08988002285ca04f31ab536
https://doi.org/10.1145/3427228.3427645
رقم الأكسشن: edsair.doi...........0296e587d08988002285ca04f31ab536
قاعدة البيانات: OpenAIRE