Layer-resolved photoelectron diffraction: Electron attenuation anisotropy in GaAs

التفاصيل البيبلوغرافية
العنوان: Layer-resolved photoelectron diffraction: Electron attenuation anisotropy in GaAs
المؤلفون: I. Bartoš, P. Jiříček, M. Cukr
المصدر: Journal of Electron Spectroscopy and Related Phenomena. 185:184-187
بيانات النشر: Elsevier BV, 2012.
سنة النشر: 2012
مصطلحات موضوعية: Diffraction, Radiation, Materials science, 010304 chemical physics, Analytical chemistry, Synchrotron radiation, Electron, Photoelectric effect, Condensed Matter Physics, 01 natural sciences, Molecular physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Excited state, 0103 physical sciences, Monolayer, Surface layer, Physical and Theoretical Chemistry, 010306 general physics, Anisotropy, Spectroscopy
الوصف: Photoelectron diffraction was used to get polar plots of the low-energy photoemission intensities from AlAs monolayer buried 2, 3 and 4 GaAs monolayers below the GaAs(0 0 1)- c (4×4) reconstructed surface. Unexpected differences in polar plots of the layer-resolved, synchrotron radiation excited photoelectron emission from even and odd AlAs monolayers were observed experimentally and obtained theoretically. This 26 eV kinetic energy photoelectron emission is accompanied by electron attenuation anisotropy and a non-exponential intensity decay in the near-surface region. The importance of the top surface layer and its reconstruction is demonstrated by theoretical simulations. Enhanced contributions of photoelectrons from individual subsurface layers in specific directions offer a way to investigate the desired subsurface atomic layers.
تدمد: 0368-2048
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::034918a708145d7c72dfbf72ecf5f16a
https://doi.org/10.1016/j.elspec.2012.06.011
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........034918a708145d7c72dfbf72ecf5f16a
قاعدة البيانات: OpenAIRE