Ultrafast pump-probe microscopic imaging of femtosecond laser-induced melting and ablation in single-crystalline silicon carbide
| العنوان: | Ultrafast pump-probe microscopic imaging of femtosecond laser-induced melting and ablation in single-crystalline silicon carbide |
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| المؤلفون: | Y. Moriai, E. Terasawa, Ryunosuke Kuroda, Daisuke Satoh, Hiroshi Ogawa, Masahito Tanaka, Tatsunori Shibuya, Yohei Kobayashi |
| المصدر: | Applied Physics A. 126 |
| بيانات النشر: | Springer Science and Business Media LLC, 2020. |
| سنة النشر: | 2020 |
| مصطلحات موضوعية: | 010302 applied physics, Laser ablation, Materials science, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, Laser, 01 natural sciences, Drude model, Molecular physics, Carbide, law.invention, chemistry.chemical_compound, chemistry, law, Picosecond, 0103 physical sciences, Femtosecond, Silicon carbide, General Materials Science, 0210 nano-technology, Ultrashort pulse |
| الوصف: | The temporal and spatial evolution of femtosecond laser-induced phase transitions and ablation on single-crystalline silicon carbide (SiC) were investigated via pump-probe microscopy in air on a time scale from approximately 100 fs to 1 ns. The largest reflectivity change was observed between 300 fs and 1 ps after excitation, which is due to free carrier generation, and the Drude model calculations indicated that the maximum free electron density was greater than 3.3 × 1021 cm−3. After a few picoseconds, there was direct evidence of the production of a rarefaction wave propagating towards the bulk, whose propagation velocity was estimated to be 3286 m/s. At delay times between a few hundreds of picoseconds and 1 ns, characteristic transient ring patterns were clearly observed and were related to the optical interference of the probe laser pulse reflected at the front surface of the ablating layer and at the interface of the non-ablating substrate. The estimated expansion velocity of the ablation front in 6H–SiC was found to be comparable to or slower than those reported for other semiconductors and dielectrics. |
| تدمد: | 1432-0630 0947-8396 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::065576a40b2ab9fd54c6a87cc1a5a0cb https://doi.org/10.1007/s00339-020-03976-7 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........065576a40b2ab9fd54c6a87cc1a5a0cb |
| قاعدة البيانات: | OpenAIRE |
Find this article in full text from Springer Verlag. | تدمد: | 14320630 09478396 |
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