DECAY PROCESS OF PHOTOELECTRONS RELATED TO SHALLOW ELECTRON TRAP IN SILVER HALIDE MICROCRYSTAL
| العنوان: | DECAY PROCESS OF PHOTOELECTRONS RELATED TO SHALLOW ELECTRON TRAP IN SILVER HALIDE MICROCRYSTAL |
|---|---|
| المؤلفون: | Xiuhong Dai, Rongjuan Liu, Rongxiang Zhang, Xiaowei Li, Shaopeng Yang, Guangsheng Fu |
| المصدر: | International Journal of Modern Physics B. 19:2592-2597 |
| بيانات النشر: | World Scientific Pub Co Pte Lt, 2005. |
| سنة النشر: | 2005 |
| مصطلحات موضوعية: | Latent image, Materials science, Silver halide, Statistical and Nonlinear Physics, Electron, Photoelectric effect, Condensed Matter Physics, Penning trap, chemistry.chemical_compound, chemistry, Scientific method, Physics::Atomic and Molecular Clusters, Physics::Atomic Physics, Atomic physics, Absorption (electromagnetic radiation), Microwave |
| الوصف: | Combining the microwave absorption dielectric spectrum experiment with computer simulation, the decay process of free photoelectrons related to shallow electron trap in silver halide microcystal is investigated. It is found that when shallow electron traps exist in silver halide, the free photoelectron decay will be sped up at the beginning, and then slowed down in the subsequent process. Shallow electron traps like a reservoir can store up photoelectrons temporarily, and then release them tardily? which results in lengthening free photoelectron lifetime or decay time and enhancing the efficiency of latent image formation. |
| تدمد: | 1793-6578 0217-9792 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::09a969a58ee225b623dafc5b97dd6469 https://doi.org/10.1142/s0217979205031377 |
| رقم الأكسشن: | edsair.doi...........09a969a58ee225b623dafc5b97dd6469 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 17936578 02179792 |
|---|