A Spintronics Memory PUF for Resilience Against Cloning Counterfeit
| العنوان: | A Spintronics Memory PUF for Resilience Against Cloning Counterfeit |
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| المؤلفون: | Mehdi B. Tahoori, Samir Ben Dodo, Sarath Mohanachandran Nair, Rajendra Bishnoi |
| المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27:2511-2522 |
| بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE), 2019. |
| سنة النشر: | 2019 |
| مصطلحات موضوعية: | Authentication, Hardware security module, Hardware_MEMORYSTRUCTURES, Computer science, business.industry, Physical unclonable function, Cryptography, 02 engineering and technology, 020202 computer hardware & architecture, ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, Hardware and Architecture, Embedded system, Computer data storage, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Resilience (network), Software, Vulnerability (computing) |
| الوصف: | With the widespread use of electronic devices in embedding or processing sensitive information, new hardware security primitives have emerged to improve the shortcomings of traditional secure data storage. One of these solutions, the physically unclonable function (PUF), which is widely used for authentication and cryptography applications, extracts the unique and unclonable value from the circuit physical properties. However, a cloning attack on memory-based PUF has been demonstrated from the circuit back-side tampering, questioning its unclonable property and opening counterfeiting vulnerability in an untrusted supply chain. Spin transfer torque-magnetic random-access memory (STT-MRAM) is a promising technology due to its nonvolatility, scalability, and CMOS compatibility, therefore envisioned to be used in many embedded secure devices. In this paper, we reveal the vulnerability of existing STT-MRAM PUF solutions to back-side attacks by modeling different levels of tampering and their impact at electrical and logical levels. We propose a tamper resilient methodology for the STT-MRAM PUF design based on its switching properties. The resilience of the proposed solution to different levels of tampering and a 100% detection are confirmed with simulation results. |
| تدمد: | 1557-9999 1063-8210 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::10d2eb515f93f3117cb1e70f5b3641f3 https://doi.org/10.1109/tvlsi.2019.2931481 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........10d2eb515f93f3117cb1e70f5b3641f3 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 15579999 10638210 |
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