Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM
| العنوان: | Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM |
|---|---|
| المؤلفون: | Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
| بيانات النشر: | IEEE, 2023. |
| سنة النشر: | 2023 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::19caa06bc8d7292417b12f57d7bb6bfd https://doi.org/10.1109/irps48203.2023.10118078 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........19caa06bc8d7292417b12f57d7bb6bfd |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |