A transmission electron microscopy investigation of inverse melting in Nb45Cr55
| العنوان: | A transmission electron microscopy investigation of inverse melting in Nb45Cr55 |
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| المؤلفون: | W. Sinkler, C. Michaelsen, Rüdiger Bormann |
| المصدر: | Journal of Materials Research. 12:1872-1884 |
| بيانات النشر: | Springer Science and Business Media LLC, 1997. |
| سنة النشر: | 1997 |
| مصطلحات موضوعية: | Amorphous metal, Materials science, Mechanical Engineering, Condensed Matter Physics, Microstructure, Grain size, Amorphous solid, Crystallography, Mechanics of Materials, Transmission electron microscopy, Phase (matter), General Materials Science, Grain boundary, High-resolution transmission electron microscopy |
| الوصف: | In inverse melting, a supersaturated crystalline phase transforms polymorphously under heat treatment to the amorphous state. Inverse melting of body-centered cubic (bcc) Nb45Cr55 is studied using transmission electron microscopy (TEM) and high resolution TEM (HRTEM). The crystalline to amorphous transformation is heterogeneous, initiating at the bcc grain boundaries. HRTEM reveals 2–3 nm domains with medium range order (MRO) in the amorphous phase. Preferred orientation of MRO domains is found on a scale corresponding to the precursor bcc grain size. Using HRTEM and calorimetry, MRO development in cosputtered Nb45Cr55 films is characterized and compared to that in the amorphous phase produced by inverse melting. |
| تدمد: | 2044-5326 0884-2914 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::1fec4c2b4e2752ce9d7e5c50d04cab84 https://doi.org/10.1557/jmr.1997.0257 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........1fec4c2b4e2752ce9d7e5c50d04cab84 |
| قاعدة البيانات: | OpenAIRE |
Find this article in full text from Springer Verlag. | تدمد: | 20445326 08842914 |
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