Film Property Analysis by FTIR on ULK Film Deposition and UV Curing Process

التفاصيل البيبلوغرافية
العنوان: Film Property Analysis by FTIR on ULK Film Deposition and UV Curing Process
المؤلفون: Xinchen Cai, Tianjiao Teng, Xuanyu Lin, Peipei Li, Xinyi Chen, Zhuo Wang, Huaqiang Tan, Qing Mi, Bo Zhang, Jintao Liu
المصدر: 2022 China Semiconductor Technology International Conference (CSTIC).
بيانات النشر: IEEE, 2022.
سنة النشر: 2022
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::23f5abfed0262b4263b3d38c63c452ca
https://doi.org/10.1109/cstic55103.2022.9856724
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........23f5abfed0262b4263b3d38c63c452ca
قاعدة البيانات: OpenAIRE