Growth and Characterization of 167Er Doped-Y2SiO5 Single Crystal
| العنوان: | Growth and Characterization of 167Er Doped-Y2SiO5 Single Crystal |
|---|---|
| المؤلفون: | Kaoru Shimizu, S. Saito, T. Tawara, H. Omi |
| المصدر: | Extended Abstracts of the 2016 International Conference on Solid State Devices and Materials. |
| بيانات النشر: | The Japan Society of Applied Physics, 2016. |
| سنة النشر: | 2016 |
| مصطلحات موضوعية: | Crystallography, Materials science, Doping, Single crystal, Characterization (materials science) |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::33b4e2294b2bba2d2f04e524d8fe4365 https://doi.org/10.7567/ssdm.2016.e-6-05l |
| رقم الأكسشن: | edsair.doi...........33b4e2294b2bba2d2f04e524d8fe4365 |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |