Growth and Characterization of 167Er Doped-Y2SiO5 Single Crystal
العنوان: | Growth and Characterization of 167Er Doped-Y2SiO5 Single Crystal |
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المؤلفون: | Kaoru Shimizu, S. Saito, T. Tawara, H. Omi |
المصدر: | Extended Abstracts of the 2016 International Conference on Solid State Devices and Materials. |
بيانات النشر: | The Japan Society of Applied Physics, 2016. |
سنة النشر: | 2016 |
مصطلحات موضوعية: | Crystallography, Materials science, Doping, Single crystal, Characterization (materials science) |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::33b4e2294b2bba2d2f04e524d8fe4365 https://doi.org/10.7567/ssdm.2016.e-6-05l |
رقم الأكسشن: | edsair.doi...........33b4e2294b2bba2d2f04e524d8fe4365 |
قاعدة البيانات: | OpenAIRE |
الوصف غير متاح. |