Laser Logic State Imaging Using Transient Voltage Collapse Circuits

التفاصيل البيبلوغرافية
العنوان: Laser Logic State Imaging Using Transient Voltage Collapse Circuits
المؤلفون: John Keane, Gwanghyeon Baek, Martin von Haartman
المصدر: International Symposium for Testing and Failure Analysis.
بيانات النشر: ASM International, 2015.
سنة النشر: 2015
مصطلحات موضوعية: Physics, Logic state, business.industry, law, Electronic engineering, Collapse (topology), Optoelectronics, Hardware_PERFORMANCEANDRELIABILITY, business, Laser, Transient voltage suppressor, Electronic circuit, law.invention
الوصف: A laser based logic state imaging (LLSI) by activating transient voltage collapse (TVC) circuits of SRAM blocks is demonstrated. In order to induce a voltage modulation on a power rail, significant numbers of TVC units are activated. The image quality of LLSI strongly depends on a number of activated TVC circuits. From this experiment, it is concluded that an additional circuit or experimental setup is not necessary for LLSI.
تدمد: 0890-1740
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ef88a5c5bade73bcd77de16005cea26
https://doi.org/10.31399/asm.cp.istfa2015p0021
رقم الأكسشن: edsair.doi...........3ef88a5c5bade73bcd77de16005cea26
قاعدة البيانات: OpenAIRE