Pattern similarity profiling using semi-supervised learning algorithm

التفاصيل البيبلوغرافية
العنوان: Pattern similarity profiling using semi-supervised learning algorithm
المؤلفون: Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization XV.
بيانات النشر: SPIE, 2021.
سنة النشر: 2021
مصطلحات موضوعية: Similarity (network science), Computer science, Metric (mathematics), Pattern matching, Semi-supervised learning, Approximate string matching, Physical design, Cluster analysis, Algorithm, Ranking (information retrieval)
الوصف: Two-dimensional pattern matching libraries are used to define known hotspots in the design space. These libraries can then be integrated into a physical design router to search and fix such hotspots prior to the design being completed and signed off. The task of searching for similar patterns to the known hotspot involves a significant manual effort in pattern match library development. This paper demonstrates an automated and comprehensive approach to profile the available design space for similar topological patterns based on the known hotspot and automatically generate a comprehensive master pattern library to fix and address the hotspot issue. This paper presents a semi-supervised learning algorithm for developing pattern similarity metric for pattern similarity ranking and clustering.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40d43d18d5b04c9fb948289250bf8f06
https://doi.org/10.1117/12.2586112
رقم الأكسشن: edsair.doi...........40d43d18d5b04c9fb948289250bf8f06
قاعدة البيانات: OpenAIRE