التفاصيل البيبلوغرافية
العنوان:
On-Wafer Metrology for a Transmission Line Integrated Terahertz Source
المؤلفون:
Ari Feldman , Christian J. Long , Nathan D. Orloff , Tara M. Fortier , Franklyn Quinlan , Bryan Bosworth , Jerome Cheron , N. R. Jungwirth , Dylan F. Williams , Kassiopeia Smith , Richard A. Chamberlin
المصدر:
Conference on Lasers and Electro-Optics .
بيانات النشر:
Optica Publishing Group, 2020.
سنة النشر:
2020
مصطلحات موضوعية:
Materials science , business.industry , Terahertz radiation , System of measurement , 02 engineering and technology , 021001 nanoscience & nanotechnology , 01 natural sciences , Metrology , 010309 optics , Transmission line , 0103 physical sciences , Phase noise , Optoelectronics , Wafer , Electronics , 0210 nano-technology , business , Network analysis
الوصف:
We developed a measurement system that combines on-wafer metrology and high-frequency network analysis to characterize the response of transmission-line integrated Er-GaAs and InGaAs photomixers up to 1 THz to support the telecommunication and electronics industry.
URL الوصول:
https://explore.openaire.eu/search/publication?articleId=doi_________::47ecf17ee8d2281602a0e32a34ed4707 https://doi.org/10.1364/cleo_at.2020.jtu2g.23
رقم الأكسشن:
edsair.doi...........47ecf17ee8d2281602a0e32a34ed4707
قاعدة البيانات:
OpenAIRE
