Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept
| العنوان: | Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept |
|---|---|
| المؤلفون: | Harsha B Variar, Satendra Kumar Gautam, Ashita Kumar, K M Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
| بيانات النشر: | IEEE, 2023. |
| سنة النشر: | 2023 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::49f7da87e65a28b7f6f0b05eef27c23c https://doi.org/10.1109/irps48203.2023.10118220 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........49f7da87e65a28b7f6f0b05eef27c23c |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |