Conduction Mechanisms for Off-State Leakage Current of Schottky Barrier Thin-Film Transistors (SBTFT)

التفاصيل البيبلوغرافية
العنوان: Conduction Mechanisms for Off-State Leakage Current of Schottky Barrier Thin-Film Transistors (SBTFT)
المؤلفون: Kuan Lin Yeh, Horng-Chih Lin, Ren-Wei Tsai, Rou-Gu Huang, Tiao-Yuan Huang
المصدر: Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials.
بيانات النشر: The Japan Society of Applied Physics, 2001.
سنة النشر: 2001
مصطلحات موضوعية: Materials science, business.industry, Thin-film transistor, Schottky barrier, Optoelectronics, Nanotechnology, State (computer science), business, Thermal conduction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4b07372dfb1f4290bc548ae89bbcfeb0
https://doi.org/10.7567/ssdm.2001.c-6-7
رقم الأكسشن: edsair.doi...........4b07372dfb1f4290bc548ae89bbcfeb0
قاعدة البيانات: OpenAIRE