Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration
| العنوان: | Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration |
|---|---|
| المؤلفون: | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| المصدر: | 2022 IEEE International Test Conference (ITC). |
| بيانات النشر: | IEEE, 2022. |
| سنة النشر: | 2022 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::4c42aabba900568d25cd0424e33752df https://doi.org/10.1109/itc50671.2022.00019 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........4c42aabba900568d25cd0424e33752df |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |