Process weakness assessment by profiling all incoming design components

التفاصيل البيبلوغرافية
العنوان: Process weakness assessment by profiling all incoming design components
المؤلفون: Jason Sweis, Ya-Chieh Lai, Yifan Zhang, MengFeng Cai, Linda Zhuang, Annie Zhu
المصدر: SPIE Proceedings.
بيانات النشر: SPIE, 2017.
سنة النشر: 2017
مصطلحات موضوعية: Computer science, visual_art, Real-time computing, Electronic component, visual_art.visual_art_medium, Profiling (information science), Reliability engineering
الوصف: Foundries normally receive a large number of designs from different customers every day. It is desired to automatically profile each incoming design to quantify certain metrics like 1) the number of polygons per GDS layers 2) what kind of electrical components the design contains 3) what the dimensions of each electrical component are 4) how frequently any size of components have been used and their physical locations. This paper will present a novel method of how to generate a complete profile of components for any particular design. The component checking flow need to be completed within hours so it will have very little impact on the tape-out time. A pre-layer checking method is also run to group commonly used layers for different electrical components and then employ different layout profiling flows. The foundry does this design chip analysis in order to find potentially weak devices due to their size or special size requirements for particular electrical components. The foundry can then take pre-emptive action to avoid yield loss or make an unnecessary mask for new incoming products before fab processing starts.
تدمد: 0277-786X
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4d2bee0d03e4577247e8e32ba4897dc4
https://doi.org/10.1117/12.2260311
رقم الأكسشن: edsair.doi...........4d2bee0d03e4577247e8e32ba4897dc4
قاعدة البيانات: OpenAIRE