Development of micro-Laue technique at Shanghai Synchrotron Radiation Facility for materials sciences
| العنوان: | Development of micro-Laue technique at Shanghai Synchrotron Radiation Facility for materials sciences |
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| المؤلفون: | Kai Chen, Chenyu Ren, Xiaoxu Huang, Zhongliang Li, Jiawei Kou, Li Jiang, Xiaohao Dong, Mengting Liu, Shuai Yan, Zhijun Li, Li Li, Renzhong Tai |
| المصدر: | Science China Materials. 64:2348-2358 |
| بيانات النشر: | Springer Science and Business Media LLC, 2021. |
| سنة النشر: | 2021 |
| مصطلحات موضوعية: | Diffraction, Materials science, business.industry, Resolution (electron density), Synchrotron radiation, 02 engineering and technology, Synchrotron light source, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Stress (mechanics), Optics, Beamline, X-ray crystallography, General Materials Science, 0210 nano-technology, business, Image resolution |
| الوصف: | Synchrotron radiation-based micro-Laue technique has showcased great application potentials in materials science study for its unprecedented crystal orientation and lattice strain/stress resolution. Here we report the updated progress in the development of the micro-Laue technique on the X-ray test beamline at Shanghai Synchrotron Radiation Facility. So far, 40 µm (h) × 50 µm (v) X-ray beam spot is routinely obtained, with the convergent angle of 0.2 mrad (h) × 0.12 mrad (v). Area scans are conducted on a GH3535 Ni-based superalloy base metal and weld joint with the same chemical composition. By analyzing the tremendous amount of Laue diffraction patterns using in-house developed software packages, the crystal orientation, elastic strain, and defect distributions are mapped and investigated. Such a successful proof-of-principle study offers first-hand experience on the further optimization of the design and construction of the scanning micro-Laue facility on the superbend beamline with improved spatial resolution and multiple functions for simultaneous chemical fluorescence mapping and in-situ microstructural evolution studies. The micro-Laue diffraction beamline at Shanghai Synchrotron Radiation Facility will provide a versatile and powerful tool for the orientation and strain/stress mapping combined with phase identification with micron-sized spatial resolution. |
| تدمد: | 2199-4501 2095-8226 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::4fa8377a968361df712057b281f96c53 https://doi.org/10.1007/s40843-021-1648-3 |
| حقوق: | OPEN |
| رقم الأكسشن: | edsair.doi...........4fa8377a968361df712057b281f96c53 |
| قاعدة البيانات: | OpenAIRE |
Find this article in full text from Springer Verlag. | تدمد: | 21994501 20958226 |
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