Hot-Carrier Induced Degradation of Ge/Sti Interfaces in Ge-on-Si Junction Devices
| العنوان: | Hot-Carrier Induced Degradation of Ge/Sti Interfaces in Ge-on-Si Junction Devices |
|---|---|
| المؤلفون: | Solomon Musibau, Jacopo Franco, Artemisia Tsiara, Ingrid De Wolf, Kristof Croes |
| بيانات النشر: | Elsevier BV, 2023. |
| سنة النشر: | 2023 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::58d48c40e9c29751fdc2ce92d29006ab https://doi.org/10.2139/ssrn.4429241 |
| رقم الأكسشن: | edsair.doi...........58d48c40e9c29751fdc2ce92d29006ab |
| قاعدة البيانات: | OpenAIRE |
| الوصف غير متاح. |