High quality electron diffraction data by precession

التفاصيل البيبلوغرافية
العنوان: High quality electron diffraction data by precession
المؤلفون: Xiaodong Zou, Daliang Zhang, Peter Oleynikov, Junliang Sun, Sven Hovmöller
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
بيانات النشر: Springer Berlin Heidelberg, 2009.
سنة النشر: 2009
مصطلحات موضوعية: Materials science, Quality (physics), Electron diffraction, Precession, Electron, Selected area diffraction, Projection (linear algebra), Symmetry (physics), Computational physics
الوصف: Electron precession [1,2] has been proposed as a method for collecting high-quality, near kinematical electron diffraction data. Here we present a quantitative investigation of data quality of K2O·7Nb2O5 (projection symmetry 4mm, a = 27.5A), using electron precession, compared to standard selected area electron diffraction (SAED) data.
ردمك: 978-3-540-85154-7
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5adc9c815b0321e9d04d8fd7907b3c2f
https://doi.org/10.1007/978-3-540-85156-1_384
رقم الأكسشن: edsair.doi...........5adc9c815b0321e9d04d8fd7907b3c2f
قاعدة البيانات: OpenAIRE