AFM Integrated with SEM and FIB: A Synergistic Union
| العنوان: | AFM Integrated with SEM and FIB: A Synergistic Union |
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| المؤلفون: | Oleg Fedoroyov, Anatoly Komissar, Dalia Yablon, Hisham Taha, A. Ignatov, Aaron Lewis, Eran Maayan |
| المصدر: | Microscopy Today. 21:26-31 |
| بيانات النشر: | Oxford University Press (OUP), 2013. |
| سنة النشر: | 2013 |
| مصطلحات موضوعية: | Materials science, General Computer Science, Ion beam, Scanning electron microscope, Atomic force microscopy, Basic research, Nanotechnology, Nanoscopic scale |
| الوصف: | Scanning electron microscopy (SEM) and ion beam milling techniques are mature nanoscale measurement technologies, whereas atomic force microscopy (AFM) is a developing technology generating intense interest in the scientific community for basic research and development. These techniques have generally existed in separate worlds. This article discusses a capability that marries these technologies through an instrument recently introduced by Nanonics, the 3TB4000. |
| تدمد: | 2150-3583 1551-9295 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::5e48a7e71c9b1368f0319114ac496124 https://doi.org/10.1017/s1551929513001090 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........5e48a7e71c9b1368f0319114ac496124 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 21503583 15519295 |
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