أعرض في EDS

Modification of Co/Pt multilayers by gallium irradiation—Part 2: The effect of patterning using a highly focused ion beam

التفاصيل البيبلوغرافية
العنوان: Modification of Co/Pt multilayers by gallium irradiation—Part 2: The effect of patterning using a highly focused ion beam
المؤلفون: V. Mathet, P. Warin, Jacques Ferré, Claude Chappert, J.P. Jamet, R. Hyndman, J. Glerak, J. N. Chapman
المصدر: Journal of Applied Physics. 90:3850-3855
بيانات النشر: AIP Publishing, 2001.
سنة النشر: 2001
مصطلحات موضوعية: Materials science, business.industry, General Physics and Astronomy, chemistry.chemical_element, Focused ion beam, Fluence, Magnetic anisotropy, Magnetization, Optics, Ferromagnetism, chemistry, Microscopy, Perpendicular, Optoelectronics, Gallium, business
الوصف: The local and collective behavior of magnetic arrays fabricated by focused ion beam (FIB) patterning of a Co/Pt multilayer is described. The arrays comprised 1 μm nonirradiated square elements separated by narrow lines which were written using the FIB. While the square elements supported perpendicular magnetization, the ion fluence used to write the lines was chosen to make the local magnetization there lie in-plane. Lorentz microscopy showed that lines were approximately 60 nm wide and that the magnetization had the expected orientation. Application of fields perpendicular and parallel to the array showed that the magnetization in the square elements and in the lines could be controlled essentially independently of each other. Magneto-optic microscopy was used to study the behavior of the arrays as a whole. Frustrated checkerboard patterns were observed, whose detailed properties depended to an extent on the fluence used to write the lines.
تدمد: 1089-7550
0021-8979
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6469747b753bc99c7d8553bc354af269
https://doi.org/10.1063/1.1401794
رقم الأكسشن: edsair.doi...........6469747b753bc99c7d8553bc354af269
قاعدة البيانات: OpenAIRE
الوصف
تدمد:10897550
00218979