Proton degradation of light-emitting diodes

التفاصيل البيبلوغرافية
العنوان: Proton degradation of light-emitting diodes
المؤلفون: Bernard G. Rax, C.E. Barnes, L.E. Selva, Allan H. Johnston
المصدر: IEEE Transactions on Nuclear Science. 46:1781-1789
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 1999.
سنة النشر: 1999
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Proton, Dopant, business.industry, Annealing (metallurgy), law.invention, Wavelength, Nuclear Energy and Engineering, law, Optoelectronics, Electrical and Electronic Engineering, Homojunction, Photonics, business, Diode, Light-emitting diode
الوصف: Proton degradation is investigated for several types of light-emitting diodes with wavelengths in the near infrared region. Several basic light-emitting diode (LED) technologies are compared, including homojunction and double-heterojunction devices. Homojunction LEDs fabricated with amphoteric dopants are far more sensitive to displacement damage than double-heterojunction LEDs, and are strongly affected by injection-enhanced annealing. Unit-to-unit variability remains an important issue for all LED technologies. For technologies, degradation of the forward voltage characteristics appears to be more significant than degradation of light output.
تدمد: 1558-1578
0018-9499
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d447870dbf1c573e536884a184479b8
https://doi.org/10.1109/23.819154
حقوق: CLOSED
رقم الأكسشن: edsair.doi...........6d447870dbf1c573e536884a184479b8
قاعدة البيانات: OpenAIRE